MCP For Claude Marketplace
Thin Film Thickness Calculator

Thin Film Thickness Calculator MCP Connector for Claude

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Calculate thin film thickness, refractive index, and extinction coefficient from interferometry and ellipsometry data.

4 tools Official Updated Oct 1, 2026 Official Vinkius Partner
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This MCP server provides specialized tools for thin-film characterization. It allows AI agents to process optical measurement data to determine physical properties of materials. Use calculate_single_layer_thickness to find the thickness of a uniform film using interference patterns. Use analyze_ellipsometry_data to extract both thickness and complex refractive index (n and k) from polarization measurements. For complex stacks, calculate_multilayer_thickness resolves individual layer thicknesses. You can also use validate_optical_constants to check if provided n and k values are physically plausible.

opticsthin-filminterferometryellipsometrymaterial-science

4 tools expose this connector's capabilities to your AI agent.

analyze_ellipsometry_data

Analyzes ellipsometry data to find thickness and optical constants (n and k)

calculate_multilayer_thickness

Calculates the thickness of individual layers in a complex multi-stack system

calculate_single_layer_thickness

Calculates the thickness of a single uniform thin film based on interference data

validate_optical_constants

Validates if provided refractive index and extinction coefficient are physically plausible

See how to talk to your AI agent using Thin Film Thickness Calculator.

What is the thickness of a single uniform thin film with wavelengths [500, 510, 520] and intensities [0.8, 0.7, 0.6], given a refractive index of 1.5 and substrate index of 1.0?

The calculated thickness of the thin film is 125.4 nm with an uncertainty of 0.2 nm.

Analyze this ellipsometry data: psi [10, 12], delta [5, 7], wavelengths [550, 560], and substrate index 1.5.

The film thickness is 45.2 nm, with a refractive index of 1.45 and an extinction coefficient of 0.01 at 550 nm.

Is a refractive index of 2.5 and extinction coefficient of 0.001 plausible for a dielectric material?

Yes, these values are physically plausible for a dielectric material.

For single layers, you need arrays of wavelengths and interference intensities. For ellipsometry, you need psi and delta values along with wavelengths.

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